Scope
MAPAN-Journal Metrology Society of India is a quarterly publication. It is exclusively devoted to ScienceSubjects (Scientific, Industrial or Legal). It has been fulfilling an important need of Science and particularly of quality practitioners by publishing exclusive articles on scientific researches. The journal publishes research communication or technical articles of current interest in measurement science; original work, tutorial or survey papers in any Science related area; reviews and analytical studies; case studies on reliability, uncertainty in measurements; and reports and results of inter comparison and proficiency testing.
This is a Multidisciplinary Scopes Journal
- Education
- Computer Science
- Mathematics
- Engineering
- Medicine
- Physics
- Chemistry
- Biology
- Metreology
- Agriculture
- Environment
- Psychology
- Astronomy
- Social Human Sciences
- Architecture
- Economy
- Geology
- Mineral Studies
Editor-In-Chief
Sanjay Yadav
CSIR National Physical Laboratory of India, New Delhi, India
Managing Editors
- Naveen GargCSIR National Physical Laboratory of India, New Delhi, India
- Shiv Kumar JaiswalCSIR National Physical Laboratory of India, New Delhi, India
Associate Editors
- Ashish AgarwalCSIR National Physical Laboratory of India, New Delhi, India
- Ravinder AgarwalThapar Institute of Engineering & Technology, Patiāla, India
- Shankar G. AggarwalCSIR National Physical Laboratory of India, New Delhi, India
- S. K. JhaBhabha Atomic Research Centre, Mumbai, India
- Harish KumarNational Institute of Technology Delhi, New Delhi, India
- Kuldeep S. NaglaDr. B. R. Ambedkar National Institute of Technology Jalandhar, Jalandhar, India
- Shailesh M PandeyNational Institute of Technology Patna, Patna, India
- Kamlesh PatelUniversity of Delhi, New Delhi, India
- Shanay RabUniversity of Brighton, Brighton, United Kingdom
- Ciro Alberto SánchezInstituto Nacional de Metrología de Colombia, Bogotá, Colombia
- Sudhir Kumar SharmaCSIR National Physical Laboratory of India, New Delhi, India
- Devraj SinghAmity School of Engineering and Technology, Delhi, India
- Meher WanCSIR-NIScPR: CSIR-National Institute of Science Communication & Policy Research, New Delhi, India
Editoral Board
- Venugopal AchantaCSIR National Physical Laboratory of India, New Delhi, India
- Mr. Anil AgarwalMeasurement Science and Standards, National Research Council Canada, Ottawa, Canada
- D. K. AswalBhabha Atomic Research Centre, Mumbai, India
- Wolfram BremserFederal Institute For Materials Research and Testing, Berlin, Germany
- K.P ChaudharyEx-scientist, CSIR National Physical Laboratory of India, New Delhi, India
- Seng-Jue ChenCenter for Measurement Standards (CMS, Industrial Technology Research Institute, Hsinchu, Taiwan
- Victoria Anne ColemanNational Measurement Institute, Sydney, Australia
- Stuart DavidsonNational Physical Laboratory, London, United Kingdom
- Joachim FischerPhysikalisch-Technische Bundesanstalt, Braunschweig, Germany
- Peter FiskNational Measurement Institute, Sydney, Australia
- Prof. Abid HaleemFaculty of Engineering and Technology, Jamia Millia Islamia, New Delhi, India
- T.J.B.M. JanssenNational Physical Laboratory, London, United Kingdom
- Tokihiko KobataNational Metrology Institute of Japan (NMIJ), lbaraki, Japan
- R. K. KotnalaEx-scientist, CSIR National Physical Laboratory of India, New Delhi, India
- Mr. Anil KumarCSIR National Physical Laboratory of India, New Delhi, India
- Ma LiandiNational Institute of Metrology, Beijing, China
- Thomas LiewAgency for Science, Technology and Research, Singapore, Singapore
- Ranjana MehrotraCSIR National Physical Laboratory of India, New Delhi, India
- Martin MiltonBureau international des poids et mesures, Saint-Cloud, France
- Vinay Shankar PandeyNational Institute of Technology Delhi, New Delhi, India
- B. P. PatelIndian Institute of Technology Delhi, New Delhi, India
- Mr. A. K. SaxenaEx-scientist, CSIR National Physical Laboratory of India, New Delhi, India
- A. SenguptaEx-scientist, CSIR National Physical Laboratory of India, New Delhi, India
- J.H. ShawCenter for Measurement Standards (CMS), Industrial Technology Research Institute, Hsinchu, Taiwan
- Rajveer SinghAmbedkar Institute of Advanced Communication Technologies and Research (AIACTR), New Delhi, India
- Toshiyuki TakatsujiNational Metrology Institute of Japan (NMIJ), lbaraki, Japan
- J. C. Torres-GuzmánCentro Nacional de Metrología (CENAM), Mexico
- Takashi UsudaNational Metrology Institute of Japan (NMIJ), lbaraki, Japan
- Costas VarotsosNational and Kapodistrian University of Athens, Athens, Greece
- Mr. Ian VeldmanNational Metrology Institute of South Africa, Pretoria, South Africa
- Sam-Yong WooKorea Research Institute of Standards and Science, Daejeon, South Korea